In-plane strain control of the magnetic remanence and cation-charge redistribution in CoFe2O4 thin film grown on a piezoelectric substrate
슈퍼관리자
2021-05-21
In-plane strain control of the magnetic remanence and cation-charge redistribution in CoFe2O4 thin film grown on a piezoelectric substrate
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Authors :
Jung H. Park, Jung-Hoon Lee, Min G. Kim, Young Kyu Jeong, Min-Ae Oak, Hyun Myung Jang, Hyoung Joon Choi, and James F. Scott
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Journal :
Phys. Rev. B
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Vol :
81
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Page :
134401
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Year :
2010
Abstract
Strain engineering of the magnetic property is an important subject in the study of multiferroic materials.Here we propose a multiferroic bilayer structure in which the magnetic remanence is controlled by the in-plane
strain of the top CFO (CoFe2O4) layer epitaxially constrained by the bottom Pb(Mg1/3Nb2/3)O3-PbTiO3 pi-ezoelectric substrate. We have shown that the room-temperature magnetic remanence (MR) of the 100-nm-thick
CFO layer is enhanced by 35.4% when an electric field of 10 kV/cm is applied. The MR value of our bilayer
structure was shown to be linearly proportional to the magnitude of the in-plane compressive strain which, in
turn, was proportional to the applied field strength. Synchrotron x-ray absorption near-edge structure study
supports a scenario of the cation-charge redistribution between Co2+ and Fe3+ ions under the condition of an
electric-field-induced in-plane compressive strain.